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Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]. - 3rd ed. - New York : Kluwer Academic/Plenum Publishers, c2003. - xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)

Además contiene CD.

The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of in the SEM Specimen - Qualitative X-Ray analysis

ISBN: 9780306472923

Subjects--Topical Terms:
Scanning electron microscopy.
X-ray microanalysis.

Dewey Class. No.: 502/.8/25 / S283