| 000 | 00970cam a22002294a 4500 | ||
|---|---|---|---|
| 999 |
_c1732 _d1732 |
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| 005 | 20180226112255.0 | ||
| 008 | 020803s2003 nyua b 001 0 eng | ||
| 020 | _a9780306472923 | ||
| 040 | _aB-IKIAM | ||
| 041 | _aENG | ||
| 082 | 0 | 0 |
_a502/.8/25 _bS283 |
| 245 | 0 | 0 |
_aScanning electron microscopy and x-ray microanalysis / _cJoseph I. Goldstein ... [et al.]. |
| 250 | _a3rd ed. | ||
| 260 |
_aNew York : _bKluwer Academic/Plenum Publishers, _cc2003. |
||
| 300 |
_axix, 689 p. : _bill. (some col.) ; _c26 cm. + _e1 CD-ROM (4 3/4 in.) |
||
| 500 | _aAdemás contiene CD. | ||
| 505 | _aThe SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of in the SEM Specimen - Qualitative X-Ray analysis | ||
| 650 | 0 | _aScanning electron microscopy. | |
| 650 | 0 | _aX-ray microanalysis. | |
| 700 | 1 | _aGoldstein, Joseph, | |
| 942 |
_2ddc _aB-IKIAM _b26-2-2018 _cBK _zbv. |
||