000 00970cam a22002294a 4500
999 _c1732
_d1732
005 20180226112255.0
008 020803s2003 nyua b 001 0 eng
020 _a9780306472923
040 _aB-IKIAM
041 _aENG
082 0 0 _a502/.8/25
_bS283
245 0 0 _aScanning electron microscopy and x-ray microanalysis /
_cJoseph I. Goldstein ... [et al.].
250 _a3rd ed.
260 _aNew York :
_bKluwer Academic/Plenum Publishers,
_cc2003.
300 _axix, 689 p. :
_bill. (some col.) ;
_c26 cm. +
_e1 CD-ROM (4 3/4 in.)
500 _aAdemás contiene CD.
505 _aThe SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of in the SEM Specimen - Qualitative X-Ray analysis
650 0 _aScanning electron microscopy.
650 0 _aX-ray microanalysis.
700 1 _aGoldstein, Joseph,
942 _2ddc
_aB-IKIAM
_b26-2-2018
_cBK
_zbv.