TY  - BOOK
AU  - Goldstein,Joseph
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9780306472923
U1  - 502/.8/25 
PY  - 2003///
CY  - New York
PB  - Kluwer Academic/Plenum Publishers
KW  - Scanning electron microscopy
KW  - X-ray microanalysis
N1  - Además contiene CD; The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of in the SEM Specimen - Qualitative X-Ray analysis
ER  -