Scanning electron microscopy and x-ray microanalysis / 
Joseph I. Goldstein ... [et al.]. 
 - 3rd ed. 
 - New York :  Kluwer Academic/Plenum Publishers,  c2003. 
 - xix, 689 p. :  ill. (some col.) ;  26 cm. +  1 CD-ROM (4 3/4 in.) 
<br/><br/> Además contiene CD. 
<br/><br/>The SEM and its modes of operation - Electron beam-specimen interactions - Image formation and interpretation - Special topics in scanning electron microscopy - Generation of in the SEM Specimen - Qualitative X-Ray analysis   
<br/><br/><label>ISBN: </label>9780306472923 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.<br/>X-ray microanalysis.
<br/><br/><label>Dewey Class. No.: </label>502/.8/25  / S283